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Message: <blockquote data-quote="BlAcKIssUeS" data-source="post: 9905197" data-attributes="member: 164">Guys... please help... <img src="/styles/default/xenforo/smilies/default/sad.gif"  class="smilie" loading="lazy" alt=":(" title="Sad    :(" data-shortname=":(" />I have to submit follwoing report for my finals and I dont know how to do it...<img src="/styles/default/xenforo/smilies/default/no.gif"  class="smilie" loading="lazy" alt=":no:" title="No    :no:" data-shortname=":no:" />If anyone good at doing the following please reply.... It will be a great help for me...I have to measure widths in a silicon substrate which is below 100nm.. Using optical interferometry and ANN. First I have to draw a model of track in the range below 351*5nmParameters used in a optical system are as follows;Number of Sampling points = N= 4096Distance between each sampling point=delx1=5nmWave length=wave= 500nmAperture Size = ana= 0.3focal length = flenght= 18mmReflectivity of the object surface at a particular discrete point = ampl = 0.5 ampu = 1Size of optical track width = nw1Size of optical track width = nw2Then I have to normalize the input and train in Neural Network..Neural Network Consist of 8 input layers 5 hidden layers and 1 output...Please please help...! <img src="/styles/default/xenforo/smilies/default/eek.gif"  class="smilie" loading="lazy" alt=":eek:" title="eek    :eek:" data-shortname=":eek:" /></blockquote>

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