Guys... please help... 
I have to submit follwoing report for my finals and I dont know how to do it...
If anyone good at doing the following please reply.... It will be a great help for me...
I have to measure widths in a silicon substrate which is below 100nm..
Using optical interferometry and ANN.
First I have to draw a model of track in the range below 351*5nm
Parameters used in a optical system are as follows;
Number of Sampling points = N= 4096
Distance between each sampling point=delx1=5nm
Wave length=wave= 500nm
Aperture Size = ana= 0.3
focal length = flenght= 18mm
Reflectivity of the object surface at a particular discrete point = ampl = 0.5 ampu = 1
Size of optical track width = nw1
Size of optical track width = nw2
Then I have to normalize the input and train in Neural Network..
Neural Network Consist of 8 input layers 5 hidden layers and 1 output...
Please please help...!
I have to submit follwoing report for my finals and I dont know how to do it...
If anyone good at doing the following please reply.... It will be a great help for me...
I have to measure widths in a silicon substrate which is below 100nm..
Using optical interferometry and ANN.
First I have to draw a model of track in the range below 351*5nm
Parameters used in a optical system are as follows;
Number of Sampling points = N= 4096
Distance between each sampling point=delx1=5nm
Wave length=wave= 500nm
Aperture Size = ana= 0.3
focal length = flenght= 18mm
Reflectivity of the object surface at a particular discrete point = ampl = 0.5 ampu = 1
Size of optical track width = nw1
Size of optical track width = nw2
Then I have to normalize the input and train in Neural Network..
Neural Network Consist of 8 input layers 5 hidden layers and 1 output...
Please please help...!
